Yashilin Analyze Rocket Gun's Low Temperature Test Method (Part II)

In the above, we talked about GJB 6458.20-2008 rocket test method part 20: The test equipment and test requirements are explained in the low temperature test. Let's take a look at the recovery after the test and the final test. What are the requirements.

4. Recovery

After the test, the test sample was placed in a low temperature test chamber, and the low temperature box was recovered at a temperature change rate of not more than 10 ° C / min under the conditions specified in 3.1 until the test sample reached temperature stability.

5. Final inspection

After recovery, the test samples were examined for appearance, mechanical properties, and electrical properties under the conditions specified in 3.1, and the test data was recorded.

(2) low temperature work

Pretreatment

Same as (1).1

2. Initial detection

Same as (1).2

3. Procedure

a. Put the test sample into the low temperature test chamber and simulate the actual use state. The exposed mechanical and electrical interfaces in actual work should remain as they are. The mechanical and electrical interfaces to be protected in actual work should be properly covered.

b. After the temperature of the low temperature test chamber is lowered to -40 °C ± 2 °C (except for special requirements), it remains unchanged until the temperature is stable. Then start the work, work time is 4h (except special requirements), test, and record the test data.

4. Recovery

Same as (1).4

5. Final inspection

After recovery, the test samples were examined for appearance, mechanical properties, and electrical properties, and the test data was recorded.

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